Effects of Cu Contamination on the Electrical Properties of Multicrystalline Silicon Purified by Directional Solidification Route: Fid-Bau Portal

Effects of Cu Contamination on the Electrical Properties of Multicrystalline Silicon Purified by Directional Solidification Route

Li, J. / Chen, X.H. / Ma, W.H. / Zhang, C. / Wei, K.X.

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Effects of Cu Contamination on the Electrical Properties of Multicrystalline Silicon Purified by Directional Solidification Route

Li, J. / Chen, X.H. / Ma, W.H. / Zhang, C. / Wei, K.X.

Effects of Cu Contamination on the Electrical Properties of Multicrystalline Silicon Purified by Directional Solidification Route

Li, J. / Chen, X.H. / Ma, W.H. / Zhang, C. / Wei, K.X.

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Check availability in my library

Order at Subito €

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Document information

Title:

Effects of Cu Contamination on the Electrical Properties of Multicrystalline Silicon Purified by Directional Solidification Route

Contributors:

Li, J. (author) / Chen, X.H. (author) / Ma, W.H. (author) / Zhang, C. (author) / Wei, K.X. (author)

Published in:

MATERIALS SCIENCE FORUM ; 809/810 ; 846-854

Publication date:

2015-01-01

Size:

9 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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