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    Characterization of DC reactive magnetron sputtered NiO films using spectroscopic ellipsometry

    New search for: Peng, T. C.
    New search for: Xiao, X. H.
    New search for: Han, X. Y.
    New search for: Zhou, X. D.
    New search for: Wu, W.
    New search for: Ren, F.
    New search for: Jiang, C. Z.

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    Characterization of DC reactive magnetron sputtered NiO films using spectroscopic ellipsometry

    New search for: Peng, T. C.
    New search for: Xiao, X. H.
    New search for: Han, X. Y.
    New search for: Zhou, X. D.
    New search for: Wu, W.
    New search for: Ren, F.
    New search for: Jiang, C. Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of DC reactive magnetron sputtered NiO films using spectroscopic ellipsometry

    New search for: Peng, T. C.
    New search for: Xiao, X. H.
    New search for: Han, X. Y.
    New search for: Zhou, X. D.
    New search for: Wu, W.
    New search for: Ren, F.
    New search for: Jiang, C. Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of DC reactive magnetron sputtered NiO films using spectroscopic ellipsometry

    Contributors:

    Peng, T. C. (author) / Xiao, X. H. (author) / Han, X. Y. (author) / Zhou, X. D. (author) / Wu, W. (author) / Ren, F. (author) / Jiang, C. Z. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 257 ; 5908-5912

    Publication date:

    2011-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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