A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Electromigration-induced strain relaxation in Cu conductor lines
Electromigration-induced strain relaxation in Cu conductor lines
Electromigration-induced strain relaxation in Cu conductor lines
Zhang, H. (author) / Cargill, G.S. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 26 ; 498-502
2011-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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