Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    The Early Stage of Dislocation Process around a Crack Tip Observed by HVEM-Tomography in Silicon Single Crystals

    New search for: Tanaka, M.
    New search for: Sadamatsu, S.
    New search for: Nakamura, H.
    New search for: Higashida, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    The Early Stage of Dislocation Process around a Crack Tip Observed by HVEM-Tomography in Silicon Single Crystals

    New search for: Tanaka, M.
    New search for: Sadamatsu, S.
    New search for: Nakamura, H.
    New search for: Higashida, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The Early Stage of Dislocation Process around a Crack Tip Observed by HVEM-Tomography in Silicon Single Crystals

    New search for: Tanaka, M.
    New search for: Sadamatsu, S.
    New search for: Nakamura, H.
    New search for: Higashida, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    The Early Stage of Dislocation Process around a Crack Tip Observed by HVEM-Tomography in Silicon Single Crystals

    Contributors:

    Tanaka, M. (author) / Sadamatsu, S. (author) / Nakamura, H. (author) / Higashida, K. (author)

    Published in:

    New Trends for Micro- and Nano Analyses ; 352-357

    MATERIALS TRANSACTIONS ; 52

    Publication date:

    2011-01-01

    Size:

    6 pages

    ISSN:

    1345-9678

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    HVEM observations of dislocation structures near a crack tip in MgO crystals

    Higashida, K. / Narita, N. / Onodera, R. et al. | British Library Online Contents | 1997

    HVEM Study of Crack Tip Dislocations in Silicon Crystals

    Higashida, K. / Tanaka, M. / Onodera, R. | British Library Online Contents | 2005

    HVEM observation of crack tip dislocations in silicon crystals

    Higashida, K. / Kawamura, T. / Morikawa, T. et al. | British Library Online Contents | 2001

    Microstructure of plastic zones around crack tips in silicon revealed by HVEM and AFM

    Tanaka, M. / Higashida, K. / Haraguchi, T. | British Library Online Contents | 2004

    HVEM high-temperature in situ straining experiments on cubic zirconia single crystals

    Baither, D. / Baufeld, B. / Messerschmidt, U. et al. | British Library Online Contents | 1997

    Back to top