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    Inhomogeneous optoelectronic and microstructure property distribution across the substrate of ZnO:Al films deposited by room temperature magnetron sputtering

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    Inhomogeneous optoelectronic and microstructure property distribution across the substrate of ZnO:Al films deposited by room temperature magnetron sputtering

    New search for: Wang, T.
    New search for: Diao, X.
    New search for: Wang, X.

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    Inhomogeneous optoelectronic and microstructure property distribution across the substrate of ZnO:Al films deposited by room temperature magnetron sputtering

    New search for: Wang, T.
    New search for: Diao, X.
    New search for: Wang, X.

    Access

    Access via TIB
    Check availability in my library
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    Access

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    Document information
    Title:

    Inhomogeneous optoelectronic and microstructure property distribution across the substrate of ZnO:Al films deposited by room temperature magnetron sputtering

    Contributors:

    Wang, T. (author) / Diao, X. (author) / Wang, X. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 257 ; 9773-9779

    Publication date:

    2011-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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