Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Inhomogeneous optoelectronic and microstructure property distribution across the substrate of ZnO:Al films deposited by room temperature magnetron sputtering
Inhomogeneous optoelectronic and microstructure property distribution across the substrate of ZnO:Al films deposited by room temperature magnetron sputtering
Inhomogeneous optoelectronic and microstructure property distribution across the substrate of ZnO:Al films deposited by room temperature magnetron sputtering
APPLIED SURFACE SCIENCE ; 257 ; 9773-9779
01.01.2011
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2002
|Characterization of ZnO:Al Films Deposited on Organic Substrate by r.f. Magnetron Sputtering
British Library Online Contents | 2003
|British Library Online Contents | 2011
|Studies on ZnO:Al thin films deposited by in-line reactive mid-frequency magnetron sputtering
British Library Online Contents | 2003
|British Library Online Contents | 2009
|