Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Piezoresistive Sensitivity and Al Ohmic Contact of Highly Doped Polycrystalline Silicon Nano Thin Films

    New search for: Shi, C.Z.
    New search for: Liu, X.W.
    New search for: Wu, X.
    New search for: Zheng, H.T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Piezoresistive Sensitivity and Al Ohmic Contact of Highly Doped Polycrystalline Silicon Nano Thin Films

    New search for: Shi, C.Z.
    New search for: Liu, X.W.
    New search for: Wu, X.
    New search for: Zheng, H.T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Piezoresistive Sensitivity and Al Ohmic Contact of Highly Doped Polycrystalline Silicon Nano Thin Films

    New search for: Shi, C.Z.
    New search for: Liu, X.W.
    New search for: Wu, X.
    New search for: Zheng, H.T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Piezoresistive Sensitivity and Al Ohmic Contact of Highly Doped Polycrystalline Silicon Nano Thin Films

    Contributors:

    Shi, C.Z. (author) / Liu, X.W. (author) / Wu, X. (author) / Zheng, H.T. (author)

    Published in:

    KEY ENGINEERING MATERIALS ; 483 ; 789-794

    Publication date:

    2011-01-01

    Size:

    6 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Nickel and platinum ohmic contacts to polycrystalline 3C-silicon carbide

    Zhang, J. / Howe, R. T. / Maboudian, R. | British Library Online Contents | 2007

    Rapid thermal annealing of in situ p-doped polycrystalline silicon thin-films

    Ahmed, W. / Afzal, A. | British Library Online Contents | 1999

    Ultrasensitive Piezoresistive All-Organic Flexible Thin Films

    Laukhina, E. / Pfattner, R. / Ferreras, L. R. et al. | British Library Online Contents | 2010

    Ohmic Contact Formation on Silicon-Doped Gallium Nitride Epilayers by Low Temperature Annealing

    Prakash, S. / Tan, L. S. / Ng, K. M. et al. | British Library Online Contents | 2000

    Experimental Investigation of Microstructure and Piezoresistive Properties of Phosphorus-Doped Hydrogenated Nanocrystalline Silicon Thin Films Prepared by PECVD

    Pan, H.B. / Ding, J.N. / Cheng, G.G. et al. | British Library Online Contents | 2014

    Back to top