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    Interfacial layers in Ta2O5 based stacks and constituent depth profiles by spectroscopic ellipsometry

    New search for: Karmakov, Y.
    New search for: Paskaleva, A.
    New search for: Atanassova, E.

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    Interfacial layers in Ta2O5 based stacks and constituent depth profiles by spectroscopic ellipsometry

    New search for: Karmakov, Y.
    New search for: Paskaleva, A.
    New search for: Atanassova, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Interfacial layers in Ta2O5 based stacks and constituent depth profiles by spectroscopic ellipsometry

    New search for: Karmakov, Y.
    New search for: Paskaleva, A.
    New search for: Atanassova, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Interfacial layers in Ta2O5 based stacks and constituent depth profiles by spectroscopic ellipsometry

    Contributors:

    Karmakov, Y. (author) / Paskaleva, A. (author) / Atanassova, E. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 258 ; 4507-4512

    Publication date:

    2012-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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