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Correlation between Strain and Excess Carrier Lifetime in a 3C-SiC Wafer
Correlation between Strain and Excess Carrier Lifetime in a 3C-SiC Wafer
Correlation between Strain and Excess Carrier Lifetime in a 3C-SiC Wafer
Yoshida, A. (author) / Kato, M. (author) / Ichimura, M. (author)
MATERIALS SCIENCE FORUM ; 717/720 ; 305-308
2012-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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