Experimental Study on Various Junction Termination Structures Applied to 15 kV 4H-SiC PiN Diodes: Fid-Bau Portal

Experimental Study on Various Junction Termination Structures Applied to 15 kV 4H-SiC PiN Diodes

Niwa, H. / Feng, G. / Suda, J. / Kimoto, T.

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Experimental Study on Various Junction Termination Structures Applied to 15 kV 4H-SiC PiN Diodes

Niwa, H. / Feng, G. / Suda, J. / Kimoto, T.

Experimental Study on Various Junction Termination Structures Applied to 15 kV 4H-SiC PiN Diodes

Niwa, H. / Feng, G. / Suda, J. / Kimoto, T.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Experimental Study on Various Junction Termination Structures Applied to 15 kV 4H-SiC PiN Diodes

Contributors:

Niwa, H. (author) / Feng, G. (author) / Suda, J. (author) / Kimoto, T. (author)

Published in:

MATERIALS SCIENCE FORUM ; 717/720 ; 973-976

Publication date:

2012-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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