Behaviour of Light Induced Defect Generation and Carrier Lifetime Degradation in Solar Grade Silicon: Fid-Bau Portal

Behaviour of Light Induced Defect Generation and Carrier Lifetime Degradation in Solar Grade Silicon

Rezgui, B.D. / Yen, V.M.-T. / Perichaud, I. / Barakel, D. / Pasquinelli, M. / Palais, O.

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Behaviour of Light Induced Defect Generation and Carrier Lifetime Degradation in Solar Grade Silicon

Rezgui, B.D. / Yen, V.M.-T. / Perichaud, I. / Barakel, D. / Pasquinelli, M. / Palais, O.

Behaviour of Light Induced Defect Generation and Carrier Lifetime Degradation in Solar Grade Silicon

Rezgui, B.D. / Yen, V.M.-T. / Perichaud, I. / Barakel, D. / Pasquinelli, M. / Palais, O.

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Title:

Behaviour of Light Induced Defect Generation and Carrier Lifetime Degradation in Solar Grade Silicon

Contributors:

Rezgui, B.D. (author) / Yen, V.M.-T. (author) / Perichaud, I. (author) / Barakel, D. (author) / Pasquinelli, M. (author) / Palais, O. (author) / Yamada-Kaneta, H. / Sakai, A.

Published in:

Defects-Recognition, Imaging and Physics in Semiconductors XIV ; 141-144

MATERIALS SCIENCE FORUM ; 725

Publication date:

2012-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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