Electron Beam Induced Current Observation of Dislocations in 4H-SiC Introduced by Mechanical Polishing

Yao, Y.Z. / Sato, K. / Sugawara, Y. et al. | British Library Online Contents | 2012

Simulation of Transmission Electron Microscope Images of Dislocations Pinned by Obstacles

Satoh, Y. / Hatano, T. / Nita, N. et al. | British Library Online Contents | 2014

Strengthening Effects of Deformation Twins and Dislocations Introduced by Short Duration Shock Pulses in Cu-8.7 Ge

S. LaRouche / E. T. Marsh / D. E. Mikkola | NTIS | 1979

Observation of Misfit Dislocations Introduced by Epi-Layer Growth on 4H-SiC

Matsuhata, H. / Yamaguchi, H. / Nagai, I. et al. | British Library Online Contents | 2009

Transmission electron microscope observations of dislocations in heteroepitaxial layers of CdTe-(CdHg)Te on GaAs

Patriarche, G. / Girard-Francois, A. / Riviere, J.-P. et al. | British Library Online Contents | 1997