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Electrical characterization of MFeOS gate stacks for ferroelectric FETs
Electrical characterization of MFeOS gate stacks for ferroelectric FETs
Electrical characterization of MFeOS gate stacks for ferroelectric FETs
Kumar, A. (author) / Rao, A. (author) / Goswami, M. (author) / Singh, B. R. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 16 ; 1603-1607
2013-01-01
5 pages
Article (Journal)
English
DDC:
621.38152
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