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    Current injection from metal to MoS2 probed at nanoscale by conductive atomic force microscopy

    New search for: Giannazzo, F.
    New search for: Fisichella, G.
    New search for: Piazza, A.
    New search for: Di Franco, S.
    New search for: Oliveri, I.P.
    New search for: Agnello, S.
    New search for: Roccaforte, F.

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    Current injection from metal to MoS2 probed at nanoscale by conductive atomic force microscopy

    New search for: Giannazzo, F.
    New search for: Fisichella, G.
    New search for: Piazza, A.
    New search for: Di Franco, S.
    New search for: Oliveri, I.P.
    New search for: Agnello, S.
    New search for: Roccaforte, F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Current injection from metal to MoS2 probed at nanoscale by conductive atomic force microscopy

    New search for: Giannazzo, F.
    New search for: Fisichella, G.
    New search for: Piazza, A.
    New search for: Di Franco, S.
    New search for: Oliveri, I.P.
    New search for: Agnello, S.
    New search for: Roccaforte, F.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Current injection from metal to MoS2 probed at nanoscale by conductive atomic force microscopy

    Contributors:

    Giannazzo, F. (author) / Fisichella, G. (author) / Piazza, A. (author) / Di Franco, S. (author) / Oliveri, I.P. (author) / Agnello, S. (author) / Roccaforte, F. (author)

    Published in:

    Materials science in semiconductor processing ; 42 ; 174-178

    Publication date:

    2016-01-01

    Size:

    5 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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