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    Source/drain metallization effects on the specific contact resistance of indium tin zinc oxide thin film transistors

    New search for: Nguyen, Cam Phu Thi
    New search for: Trinh, Thanh Thuy
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    Source/drain metallization effects on the specific contact resistance of indium tin zinc oxide thin film transistors

    New search for: Nguyen, Cam Phu Thi
    New search for: Trinh, Thanh Thuy
    New search for: Raja, Jayapal
    New search for: Le, Anh Huy Tuan
    New search for: Lee, Youn-Jung
    New search for: Dao, Vinh Ai
    New search for: Yi, Junsin

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Source/drain metallization effects on the specific contact resistance of indium tin zinc oxide thin film transistors

    New search for: Nguyen, Cam Phu Thi
    New search for: Trinh, Thanh Thuy
    New search for: Raja, Jayapal
    New search for: Le, Anh Huy Tuan
    New search for: Lee, Youn-Jung
    New search for: Dao, Vinh Ai
    New search for: Yi, Junsin

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    Source/drain metallization effects on the specific contact resistance of indium tin zinc oxide thin film transistors

    Contributors:

    Nguyen, Cam Phu Thi (author) / Trinh, Thanh Thuy (author) / Raja, Jayapal (author) / Le, Anh Huy Tuan (author) / Lee, Youn-Jung (author) / Dao, Vinh Ai (author) / Yi, Junsin (author)

    Published in:

    Materials science in semiconductor processing ; 39 ; 649-653

    Publication date:

    2015-01-01

    Size:

    5 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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