Physical, structural and topographical aspects of Zn1−xCoxSe thin films: Fid-Bau Portal

Physical, structural and topographical aspects of Zn1−xCoxSe thin films

Pawar, S.T. / Chavan, G.T. / Prakshale, V.M. / Sikora, A. / Pawar, S.M. / Kamble, S.S. / Maldar, N.N. / Deshmukh, L.P.

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Physical, structural and topographical aspects of Zn1−xCoxSe thin films

Pawar, S.T. / Chavan, G.T. / Prakshale, V.M. / Sikora, A. / Pawar, S.M. / Kamble, S.S. / Maldar, N.N. / Deshmukh, L.P.

Physical, structural and topographical aspects of Zn1−xCoxSe thin films

Pawar, S.T. / Chavan, G.T. / Prakshale, V.M. / Sikora, A. / Pawar, S.M. / Kamble, S.S. / Maldar, N.N. / Deshmukh, L.P.

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Document information

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Document information

Title:

Physical, structural and topographical aspects of Zn1−xCoxSe thin films

Contributors:

Pawar, S.T. (author) / Chavan, G.T. (author) / Prakshale, V.M. (author) / Sikora, A. (author) / Pawar, S.M. (author) / Kamble, S.S. (author) / Maldar, N.N. (author) / Deshmukh, L.P. (author)

Published in:

Materials science in semiconductor processing ; 61 ; 71-78

Publication date:

2017-01-01

Size:

8 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

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