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    Critical invisible defect detection system of thin film transistor panels using Kelvin probe force microscopy

    New search for: Park, Yonmook
    New search for: Heo, Keun

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    Critical invisible defect detection system of thin film transistor panels using Kelvin probe force microscopy

    New search for: Park, Yonmook
    New search for: Heo, Keun

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Critical invisible defect detection system of thin film transistor panels using Kelvin probe force microscopy

    New search for: Park, Yonmook
    New search for: Heo, Keun

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Critical invisible defect detection system of thin film transistor panels using Kelvin probe force microscopy

    Contributors:

    Park, Yonmook (author) / Heo, Keun (author)

    Published in:

    Applied surface science ; 375 ; 19-25

    Publication date:

    2016-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.44

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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