Amplitude or frequency modulation-detection in Kelvin probe force microscopy: Fid-Bau Portal

Amplitude or frequency modulation-detection in Kelvin probe force microscopy

Glatzel, T. / Sadewasser, S. / Lux-Steiner, M. C.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Amplitude or frequency modulation-detection in Kelvin probe force microscopy

Glatzel, T. / Sadewasser, S. / Lux-Steiner, M. C.

Amplitude or frequency modulation-detection in Kelvin probe force microscopy

Glatzel, T. / Sadewasser, S. / Lux-Steiner, M. C.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Amplitude or frequency modulation-detection in Kelvin probe force microscopy

Contributors:

Glatzel, T. (author) / Sadewasser, S. (author) / Lux-Steiner, M. C. (author)

Published in:

APPLIED SURFACE SCIENCE ; 210 ; 84-89

Publication date:

2003-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Sommerhalter, C. / Glatzel, T. / Matthes, T. W. et al. | British Library Online Contents | 2000

Kelvin Probe Force Microscopy of Molecular Surfaces

Fujihira, M. | British Library Online Contents | 1999

Kelvin probe force microscopy using near-field optical tips

Shikler, R. / Rosenwaks, Y. | British Library Online Contents | 2000

Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

Kondratenko, S.V. / Lysenko, V.S. / Kozyrev, Yu. N. et al. | British Library Online Contents | 2016

Local charge trapping in Ge nanoclustersdetected by Kelvin probe force microscopy

Kondratenko, S. V. / Lysenko, V. S. / Kozyrev, Y. N. et al. | British Library Online Contents | 2016