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Temperature dependent study of basal plane stacking faults in Ag:ZnO nanorods by Raman and photoluminescence spectroscopy
Temperature dependent study of basal plane stacking faults in Ag:ZnO nanorods by Raman and photoluminescence spectroscopy
Temperature dependent study of basal plane stacking faults in Ag:ZnO nanorods by Raman and photoluminescence spectroscopy
Khranovskyy, Volodymyr (author) / Sendova, Mariana (author) / Hosterman, Brian (author) / McGinnis, Navin (author) / Shtepliuk, Ivan (author) / Yakimova, Rositsa (author)
Materials science in semiconductor processing ; 69 ; 62-67
2017-01-01
6 pages
Article (Journal)
English
DDC:
621.38152
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