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Impact of oxide/barrier charge on threshold voltage instabilities in AlGaN/GaN metal-oxide-semiconductor heterostructures
Impact of oxide/barrier charge on threshold voltage instabilities in AlGaN/GaN metal-oxide-semiconductor heterostructures
Impact of oxide/barrier charge on threshold voltage instabilities in AlGaN/GaN metal-oxide-semiconductor heterostructures
Ťapajna, M. (author) / Drobný, J. (author) / Gucmann, F. (author) / Hušeková, K. (author) / Gregušová, D. (author) / Hashizume, T. (author) / Kuzmík, J. (author)
Materials science in semiconductor processing ; 91 ; 356-361
2019-01-01
6 pages
Article (Journal)
English
DDC:
621.38152
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