Synchrotron topography characterization of ZnTe single crystals

Zhou, W. / Dudley, M. / Wu, J. et al. | British Library Online Contents | 1994

Investigation of Defects in 4H-SiC by Synchrotron Topography, Raman Spectroscopy Imaging and Photoluminescence Spectroscopy Imaging

Pernot, E. / El Harrouni, I. / Mermoux, M. et al. | British Library Online Contents | 2003

Synchrotron White Beam Topography Studies of 2H SiC Crystals

Dudley, M. / Huang, W. / Vetter, W. M. et al. | British Library Online Contents | 2000

Characterization of Metal Matrix Composites by Synchrotron Refraction Computed Topography

Muller, B.R. / Lange, A. / Harwardt, M. et al. | British Library Online Contents | 2010

Characterization of SiC Using Synchrotron White Beam X-Ray Topography

Dudley, M. / Huang, X. | British Library Online Contents | 2000