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CERAMIC SINTERED BODY AND SUBSTRATE FOR SEMICONDUCTOR DEVICES
A ceramic sintered body (3) according to the present invention contains Zr, Al, Y and Mg; the content of Zr is from 7.5% by mass to 23.5% by mass (inclusive) in terms of ZrO2; the content of Al is from 74.9% by mass to 91.8% by mass (inclusive) in terms of Al2O3; the content of Y is from 0.41% by mass to 1.58% by mass (inclusive) in terms of Y2O3; and the content of Mg is from 0.10% by mass to 0.80% by mass (inclusive) in terms of MgO. The M-phase ratio after thermal aging of the ceramic sintered body (3) is 15% or less.
陶瓷烧结体(3)包含Zr、Al、Y和Mg,Zr的含量以ZrO2换算为7.5质量%以上且23.5质量%以下,Al的含量以Al2O3换算为74.9质量%以上且91.8质量%以下,Y的含量以Y2O3换算为0.41质量%以上且1.58质量%以下,Mg的含量以MgO换算为0.10质量%以上且0.80质量%以下。陶瓷烧结体(3)的热老化后M相率为15%以下。
CERAMIC SINTERED BODY AND SUBSTRATE FOR SEMICONDUCTOR DEVICES
A ceramic sintered body (3) according to the present invention contains Zr, Al, Y and Mg; the content of Zr is from 7.5% by mass to 23.5% by mass (inclusive) in terms of ZrO2; the content of Al is from 74.9% by mass to 91.8% by mass (inclusive) in terms of Al2O3; the content of Y is from 0.41% by mass to 1.58% by mass (inclusive) in terms of Y2O3; and the content of Mg is from 0.10% by mass to 0.80% by mass (inclusive) in terms of MgO. The M-phase ratio after thermal aging of the ceramic sintered body (3) is 15% or less.
陶瓷烧结体(3)包含Zr、Al、Y和Mg,Zr的含量以ZrO2换算为7.5质量%以上且23.5质量%以下,Al的含量以Al2O3换算为74.9质量%以上且91.8质量%以下,Y的含量以Y2O3换算为0.41质量%以上且1.58质量%以下,Mg的含量以MgO换算为0.10质量%以上且0.80质量%以下。陶瓷烧结体(3)的热老化后M相率为15%以下。
CERAMIC SINTERED BODY AND SUBSTRATE FOR SEMICONDUCTOR DEVICES
陶瓷烧结体以及半导体装置用基板
UMEDA YUJI (author) / KONO HIROSHI (author)
2021-05-11
Patent
Electronic Resource
Chinese
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