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Scanning Tunneling Microscopy: Semiconductor Surfaces, Adsorption, and Epitaxy

Feenstra, R. M.

Abstract The application of the scanning tunneling microscope (STM) to the study of clean and adsorbate covered semiconductor surfaces is discussed. Various imaging and spectroscopic methods are described, and the methods are illustrated with examples of experimental results. Emphasis is placed on the relationship between the electronic and structural properties of a surface, and the role that this relationship plays in the interpretation of STM images.

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Scanning Tunneling Microscopy: Semiconductor Surfaces, Adsorption, and Epitaxy

Feenstra, R. M.

Abstract The application of the scanning tunneling microscope (STM) to the study of clean and adsorbate covered semiconductor surfaces is discussed. Various imaging and spectroscopic methods are described, and the methods are illustrated with examples of experimental results. Emphasis is placed on the relationship between the electronic and structural properties of a surface, and the role that this relationship plays in the interpretation of STM images.

Scanning Tunneling Microscopy: Semiconductor Surfaces, Adsorption, and Epitaxy

Feenstra, R. M.

Abstract The application of the scanning tunneling microscope (STM) to the study of clean and adsorbate covered semiconductor surfaces is discussed. Various imaging and spectroscopic methods are described, and the methods are illustrated with examples of experimental results. Emphasis is placed on the relationship between the electronic and structural properties of a surface, and the role that this relationship plays in the interpretation of STM images.

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Title:

Scanning Tunneling Microscopy: Semiconductor Surfaces, Adsorption, and Epitaxy

Contributors:

Feenstra, R. M. (author)

Published in:

Scanning Tunneling Microscopy and Related Methods ; 211-240

NATO ASI Series ; 184

Publication date:

1990-01-01

Size:

30 pages

ISBN:

978-90-481-4075-6 , 978-94-015-7871-4

ISSN:

DOI:

https://doi.org/10.1007/978-94-015-7871-4_11

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Scanning Tunneling Microscope , Tunnel Current , Semiconductor Surface , Scanning Tunneling Microscope Image , Dangling Bond Physics , Physics, general , Surfaces and Interfaces, Thin Films , Physical Chemistry , Biophysics and Biological Physics

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