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    Scanning Tunneling Microscopy of Semiconductor Surfaces and Interfaces

    New search for: Tromp, R. M.
    New search for: Loenen, E. J.
    New search for: Hamers, R. J.
    New search for: Demuth, J. E.

    Abstract This paper describes recent experimental results on the geometric and electronic structure of semiconductor surfaces and interfaces obtained with Scanning Tunneling Microscopy. Effects due to the structure of the tip are also discussed.

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    Scanning Tunneling Microscopy of Semiconductor Surfaces and Interfaces

    New search for: Tromp, R. M.
    New search for: Loenen, E. J.
    New search for: Hamers, R. J.
    New search for: Demuth, J. E.

    Abstract This paper describes recent experimental results on the geometric and electronic structure of semiconductor surfaces and interfaces obtained with Scanning Tunneling Microscopy. Effects due to the structure of the tip are also discussed.

    Access

    Check access
    Check availability in my library
    Order at Subito €

    Scanning Tunneling Microscopy of Semiconductor Surfaces and Interfaces

    New search for: Tromp, R. M.
    New search for: Loenen, E. J.
    New search for: Hamers, R. J.
    New search for: Demuth, J. E.

    Abstract This paper describes recent experimental results on the geometric and electronic structure of semiconductor surfaces and interfaces obtained with Scanning Tunneling Microscopy. Effects due to the structure of the tip are also discussed.

    Access

    Check access
    Check availability in my library
    Order at Subito €

    Access

    Check access
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    Document information
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    Document information
    Title:

    Scanning Tunneling Microscopy of Semiconductor Surfaces and Interfaces

    Contributors:

    Tromp, R. M. (author) / Loenen, E. J. (author) / Hamers, R. J. (author) / Demuth, J. E. (author)

    Published in:

    The Structure of Surfaces II ; 282-291

    Springer Series in Surface Sciences ; 11

    Publication date:

    1988-01-01

    Size:

    10 pages

    ISBN:

    978-3-642-73345-1 , 978-3-642-73343-7

    ISSN:

    0931-5195

    DOI:

    https://doi.org/10.1007/978-3-642-73343-7_47

    Type of media:

    Article/Chapter (Book)

    Type of material:

    Electronic Resource

    Language:

    English

    Keywords:

    Scanning Tunneling Microscopy , Dangling Bond , Transmission Electron Diffraction , Scanning Tunneling Microscopy Study , Surface Electronic Structure Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films , Crystallography

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