Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy: Fid-Bau Portal

Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy

Schulze, A. / Hantschel, T. / Eyben, P. / Vandooren, A. / Rooyackers, R. / Mody, J. / Verhulst, A.S. / Vandervorst, W. / Materials Research Society

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Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy

Schulze, A. / Hantschel, T. / Eyben, P. / Vandooren, A. / Rooyackers, R. / Mody, J. / Verhulst, A.S. / Vandervorst, W. / Materials Research Society

Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy

Schulze, A. / Hantschel, T. / Eyben, P. / Vandooren, A. / Rooyackers, R. / Mody, J. / Verhulst, A.S. / Vandervorst, W. / Materials Research Society

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Titel:

Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy

Beteiligte:

Schulze, A. (Autor:in) / Hantschel, T. (Autor:in) / Eyben, P. (Autor:in) / Vandooren, A. (Autor:in) / Rooyackers, R. (Autor:in) / Mody, J. (Autor:in) / Verhulst, A.S. (Autor:in) / Vandervorst, W. (Autor:in) / Riel, Heike / Materials Research Society

Kongress:

MRS spring meeting; Low-dimensional functional nanostructures - fabrication, characterization and applications: symposium / ; 2010 ; San Francisco, CA

Erschienen in:

MRS spring meeting; Low-dimensional functional nanostructures - fabrication, characterization and applications: symposium / ; 59-66

MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS ; 1258

Erscheinungsdatum:

01.01.2010

Format / Umfang:

8 pages

Anmerkungen:

Includes bibliographical references and indexes.

ISBN:

9781605112350

ISSN:

0272-9172

Medientyp:

Aufsatz (Konferenz)

Format:

Sprache:

Englisch

Schlagwörter:

Low-dimensional functional nanostructures , Materials research , MRS

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