Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy: Fid-Bau Portal

Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy

Schulze, A. / Hantschel, T. / Eyben, P. / Vandooren, A. / Rooyackers, R. / Mody, J. / Verhulst, A.S. / Vandervorst, W. / Materials Research Society

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Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy

Schulze, A. / Hantschel, T. / Eyben, P. / Vandooren, A. / Rooyackers, R. / Mody, J. / Verhulst, A.S. / Vandervorst, W. / Materials Research Society

Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy

Schulze, A. / Hantschel, T. / Eyben, P. / Vandooren, A. / Rooyackers, R. / Mody, J. / Verhulst, A.S. / Vandervorst, W. / Materials Research Society

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Title:

Quantitative Two-Dimensional Carrier Mapping in Silicon Nanowire-Based Tunnel-Field Effect Transistors Using Scanning Spreading Resistance Microscopy

Contributors:

Schulze, A. (author) / Hantschel, T. (author) / Eyben, P. (author) / Vandooren, A. (author) / Rooyackers, R. (author) / Mody, J. (author) / Verhulst, A.S. (author) / Vandervorst, W. (author) / Riel, Heike / Materials Research Society

Conference:

MRS spring meeting; Low-dimensional functional nanostructures - fabrication, characterization and applications: symposium / ; 2010 ; San Francisco, CA

Published in:

MRS spring meeting; Low-dimensional functional nanostructures - fabrication, characterization and applications: symposium / ; 59-66

MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS ; 1258

Publication date:

2010-01-01

Size:

8 pages

Remarks:

Includes bibliographical references and indexes.

ISBN:

9781605112350

ISSN:

0272-9172

Type of media:

Conference paper

Type of material:

Language:

English

Keywords:

Low-dimensional functional nanostructures , Materials research , MRS

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