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Correlation between initial growth planarity and epilayer tilting in the vicinal GaAs/Si system
Correlation between initial growth planarity and epilayer tilting in the vicinal GaAs/Si system
Correlation between initial growth planarity and epilayer tilting in the vicinal GaAs/Si system
Riesz, F. (Autor:in) / Varrio, J. (Autor:in) / Pesek, A. (Autor:in) / Lischka, K. (Autor:in)
APPLIED SURFACE SCIENCE ; 75 ; 248
01.01.1994
248 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
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