Correlation between initial growth planarity and epilayer tilting in the vicinal GaAs/Si system: Fid-Bau Portal

Correlation between initial growth planarity and epilayer tilting in the vicinal GaAs/Si system

Riesz, F. / Varrio, J. / Pesek, A. / Lischka, K.

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Correlation between initial growth planarity and epilayer tilting in the vicinal GaAs/Si system

Riesz, F. / Varrio, J. / Pesek, A. / Lischka, K.

Correlation between initial growth planarity and epilayer tilting in the vicinal GaAs/Si system

Riesz, F. / Varrio, J. / Pesek, A. / Lischka, K.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Correlation between initial growth planarity and epilayer tilting in the vicinal GaAs/Si system

Contributors:

Riesz, F. (author) / Varrio, J. (author) / Pesek, A. (author) / Lischka, K. (author)

Published in:

APPLIED SURFACE SCIENCE ; 75 ; 248

Publication date:

1994-01-01

Size:

248 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 621.35

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