Characterization of SiC Epitaxial Structures using High-Resolution X-Ray Diffraction Techniques

Huang, X. R. / Dudley, M. / Cho, W. et al. | British Library Online Contents | 2004

High Resolution X-Ray Diffraction Characterization of [111]B Oriented InGaAs/GaAs MQW Structures

Sanz-Hervas, A. / Sacedon, A. / Abril, E. J. et al. | British Library Online Contents | 1997

Localised strain characterization in semiconductor structures using electron diffraction contrast imaging

Janssens, K. G. F. / Van der Biest, O. / Vanhellemont, J. et al. | British Library Online Contents | 1995

High-resolution synchrotron X-ray powder diffraction for structural characterization

Anne, M. / Bordet, P. / Hodeau, J. L. et al. | British Library Online Contents | 1993

High-resolution synchrotron X-ray powder diffraction for structural characterization

Anne, M. / Bordet, P. / Hodeau, J. L. et al. | British Library Online Contents | 1993