High resolution lifetime scan maps of silicon wafers

Palais, O. / Gervais, J. / Clerc, L. et al. | British Library Online Contents | 2000

Lifetime improvement in silicon wafers using weak magnetic fields

Kuryliuk, A. / Steblenko, L. / Nadtochiy, A. et al. | British Library Online Contents | 2017

Organic contamination of silicon wafers by buffered oxide etching

Beyer, M. / Budde, K. / Holzapfel, W. | British Library Online Contents | 1993

Generation of Oxidation Induced Stacking Faults in Cz Silicon Wafers

Sueoka, K. / Akatsuka, M. / Nishihara, K. et al. | British Library Online Contents | 1995

Minority carrier lifetime and metallic-impurity mapping in silicon wafers

Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001