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Reliability study of sub-micron titanium silicide contacts
Reliability study of sub-micron titanium silicide contacts
Reliability study of sub-micron titanium silicide contacts
Lin, C. C. (Autor:in) / Chen, W. S. (Autor:in) / Hwang, H. L. (Autor:in) / Hsu, K. Y. J. (Autor:in) / Liou, H. K. (Autor:in) / Tu, K. N. (Autor:in)
APPLIED SURFACE SCIENCE ; 92 ; 660-664
01.01.1996
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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