Defect Characterization of Homo-Epitaxially Grown 6H-SiC on (0001) Silicon and (0001) Carbon Faces

Stoemenos, J. / Di Cioccio, L. / Papaioannou, V. et al. | British Library Online Contents | 1998

Vacancy Defects in Low-Temperature-Grown GaAs Observed by Continuous and Pulsed Slow Positrons

Gebauer, J. / Krause-Rehberg, R. / Eichler, S. et al. | British Library Online Contents | 1997

Effect of precursor on epitaxially grown of ZnO thin film on p-GaN/sapphire (0001) substrate by hydrothermal technique

Sahoo, T. / Ju, J. W. / Kannan, V. et al. | British Library Online Contents | 2008

Evolution of Defect Profiles in He-Implanted Silicon Studied by Slow Positrons

Brusa, R. S. / Karwasz, G. P. / Tiengo, N. et al. | British Library Online Contents | 1997

Thickness dependence of optical properties of VO2 thin films epitaxially grown on sapphire (0001)

Xu, G. / Jin, P. / Tazawa, M. et al. | British Library Online Contents | 2005