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Defect structures in heavily In-doped II-VI semiconductors
Defect structures in heavily In-doped II-VI semiconductors
Defect structures in heavily In-doped II-VI semiconductors
Ostheimer, V. (Autor:in) / Filz, T. (Autor:in) / Hamann, J. (Autor:in) / Lauer, S. (Autor:in) / Weber, D. (Autor:in) / Wolf, H. (Autor:in) / Wichert, T. (Autor:in) / Davies, G. / Nazare, M. H.
01.01.1997
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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