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RBS-ERDA, XPS and XRD characterizations of PECVD tungsten nitride films
RBS-ERDA, XPS and XRD characterizations of PECVD tungsten nitride films
RBS-ERDA, XPS and XRD characterizations of PECVD tungsten nitride films
Meunier, C. (Autor:in) / Monteil, C. (Autor:in) / Savall, C. (Autor:in) / Palmino, F. (Autor:in) / Weber, J. (Autor:in) / Berjoan, R. (Autor:in) / Durand, J. (Autor:in)
APPLIED SURFACE SCIENCE ; 125 ; 313-320
01.01.1998
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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