Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Ellipsometric Characterization of Copper Deposits
Ellipsometric Characterization of Copper Deposits
Ellipsometric Characterization of Copper Deposits
Sandmann, G. (Autor:in) / Plieth, W. (Autor:in) / Lacconi, G. I. (Autor:in) / Lopez Teijelo, M. (Autor:in)
MATERIALS SCIENCE FORUM ; 289/292 ; 465-470
01.01.1998
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Ellipsometric characterization of nanocrystals in porous silicon
British Library Online Contents | 2006
|Ellipsometric characterization of oxidized porous silicon layer structures
British Library Online Contents | 2000
|In situ ellipsometric study of electrodeposition of manganese films on copper
British Library Online Contents | 2011
|Ellipsometric Characterization on Multi-Layered Thin Film Systems during Hydrogenation
British Library Online Contents | 2007
|Ellipsometric characterization of thin porous GaAs layers formed in HF solutions
British Library Online Contents | 2000
|