Positron Lifetime and Doppler Broadening Study of Defects Created by Swift Ion Irradiation in Sapphire

Liszkay, L. / Gordo, P. M. / Havancsak, K. et al. | British Library Online Contents | 2004

Depth profiling of defects in nitrogen implanted silicon using a slow positron beam

Taylor, J.W. / Saleh, A.S. / Rice-Evans, P.C. et al. | British Library Online Contents | 1999

The Study of Defects Induced by the Implantation of O Ions into GaAs by a Slow Positron Beam

Fujii, S. / Wei, L. / Tanigawa, S. | British Library Online Contents | 1993

Slow positron beam study of corrosion-related defects in pure iron

Wu, Y. C. / Chen, Y. Q. / Wang, B. et al. | British Library Online Contents | 2006

Photoluminescence studies of defects created in nitrogen-doped silicon during annealing under enhanced pressure

Surma, B. / Misiuk, A. / Wnuk, A. et al. | British Library Online Contents | 2004