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Formation and annealing of defects during high-temperature processing of ion-implanted epitaxial silicon: the role of dopant implants
Formation and annealing of defects during high-temperature processing of ion-implanted epitaxial silicon: the role of dopant implants
Formation and annealing of defects during high-temperature processing of ion-implanted epitaxial silicon: the role of dopant implants
Giri, P.K. (Autor:in) / Galvagno, G. (Autor:in) / La Ferla, A. (Autor:in) / Rimini, E. (Autor:in) / Coffa, S. (Autor:in) / Raineri, V. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 71 ; 186 - 191
01.01.2000
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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