FTIR reflectance characterization of SIMOX buried oxide layers [3425-01]

Yakovlev, V. A. / Charpenay, S. / Rosenthal, P. A. et al. | British Library Conference Proceedings | 1998

Perpendicular coercive force of thick CoFeB thin films grown on silicon substrate

Sun, B. / Li, G. Q. / Zhao, W. X. et al. | British Library Online Contents | 2014

Ellipsometric analysis of ultrathin oxide layers on SIMOX wafers

Motooka, T. / Kusano, Y. / Nisihira, K. et al. | British Library Online Contents | 2000

Investigation of Thick 3C-SiC Films Re-Grown on Thin 35 nm "Flash Lamp Annealed" 3C-SiC Layers

Ferro, G. / Panknin, D. / Stoemenos, J. et al. | British Library Online Contents | 2004

Characterization of GaN layers grown on porous silicon

Missaoui, A. / Saadoun, M. / Boufaden, T. et al. | British Library Online Contents | 2001