Analysis on interface states of ultrathin-SiO2/Si(111)

Hasunuma, R. / Ando, A. / Miki, K. et al. | British Library Online Contents | 2000

Accurate detection of interface between SiO2 film and Si substrate

Qian, H. X. / Zhou, W. / Li, X. M. et al. | British Library Online Contents | 2007

First principles calculations of hydrogen annealed amorphous SiO2 structures and Si/SiO2 interface for non volatile memories

Courtot-Descharles, A. / Paillet, P. / Leray, J. L. et al. | British Library Online Contents | 2000

Cathodoluminescence study of Si/SiO2 interface structure

Zamoryarskaya, M. V. / Sokolov, V. I. / Plotnikov, V. | British Library Online Contents | 2004

SiO2/SiC interface proved by positron annihilation

Maekawa, M. / Kawasuso, A. / Yoshikawa, M. et al. | British Library Online Contents | 2003