Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Detection of interface states correlated with SiO2/Si(111) interface structures

    New search for: Watanabe, N.
    New search for: Teramoto, Y.
    New search for: Omura, A.
    New search for: Nohira, H.
    New search for: Hattori, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Detection of interface states correlated with SiO2/Si(111) interface structures

    New search for: Watanabe, N.
    New search for: Teramoto, Y.
    New search for: Omura, A.
    New search for: Nohira, H.
    New search for: Hattori, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Detection of interface states correlated with SiO2/Si(111) interface structures

    New search for: Watanabe, N.
    New search for: Teramoto, Y.
    New search for: Omura, A.
    New search for: Nohira, H.
    New search for: Hattori, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Detection of interface states correlated with SiO2/Si(111) interface structures

    Contributors:

    Watanabe, N. (author) / Teramoto, Y. (author) / Omura, A. (author) / Nohira, H. (author) / Hattori, T. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 166 ; 460-464

    Publication date:

    2000-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Analysis on interface states of ultrathin-SiO2/Si(111)

    Hasunuma, R. / Ando, A. / Miki, K. et al. | British Library Online Contents | 2000

    Accurate detection of interface between SiO2 film and Si substrate

    Qian, H. X. / Zhou, W. / Li, X. M. et al. | British Library Online Contents | 2007

    First principles calculations of hydrogen annealed amorphous SiO2 structures and Si/SiO2 interface for non volatile memories

    Courtot-Descharles, A. / Paillet, P. / Leray, J. L. et al. | British Library Online Contents | 2000

    Cathodoluminescence study of Si/SiO2 interface structure

    Zamoryarskaya, M. V. / Sokolov, V. I. / Plotnikov, V. | British Library Online Contents | 2004

    SiO2/SiC interface proved by positron annihilation

    Maekawa, M. / Kawasuso, A. / Yoshikawa, M. et al. | British Library Online Contents | 2003

    Back to top