Characterization of Basal Plane Dislocations in 4H-SiC Substrates by Topography Analysis of Threading Edge Dislocations in Epilayers

Kamata, I. / Nagano, M. / Tsuchida, H. | British Library Online Contents | 2010

High-Resolution Topography Analysis on Threading Edge Dislocations in 4H-SiC Epilayers

Kamata, I. / Nagano, M. / Tsuchida, H. et al. | British Library Online Contents | 2009

Conversion of Basal Plane Dislocations to Threading Edge Dislocations by Annealing 4H-SiC Epilayers at High Temperatures

Zhang, X. / Nagano, M. / Tsuchida, H. | British Library Online Contents | 2013

Photoluminescence Imaging and Discrimination of Threading Dislocations in 4H-SiC Epilayers

Nagano, M. / Kamata, L. / Tsuchida, H. | British Library Online Contents | 2013

Photoluminescence Imaging and Discrimination of Threading Dislocations in 4H-SiC Epilayers

Nagano, M. / Kamata, I. / Tsuchida, H. | British Library Online Contents | 2014