Photoluminescence Imaging and Discrimination of Threading Dislocations in 4H-SiC Epilayers: Fid-Bau Portal

Photoluminescence Imaging and Discrimination of Threading Dislocations in 4H-SiC Epilayers

Nagano, M. / Kamata, I. / Tsuchida, H.

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Photoluminescence Imaging and Discrimination of Threading Dislocations in 4H-SiC Epilayers

Nagano, M. / Kamata, I. / Tsuchida, H.

Photoluminescence Imaging and Discrimination of Threading Dislocations in 4H-SiC Epilayers

Nagano, M. / Kamata, I. / Tsuchida, H.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Dokumentinformationen

Ähnliche Titel

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Dokumentinformationen

Titel:

Photoluminescence Imaging and Discrimination of Threading Dislocations in 4H-SiC Epilayers

Beteiligte:

Nagano, M. (Autor:in) / Kamata, I. (Autor:in) / Tsuchida, H. (Autor:in) / Okumura, H. / Harima, H. / Kimoto, T. / Yoshimoto, M. / Watanabe, H. / Hatayama, T. / Matsuura, H.

Erschienen in:

Silicon Carbide and Related Materials 2013 PART 1 Selected, peer reviewed papers from the 15^t^h International Conference on Silicon Carbide and Related Materials, (ICSCRM 2013), September 29 - October 4, 2013, Miyazaki, Japan ; 313-318

MATERIALS SCIENCE FORUM ; 778/780

Erscheinungsdatum:

01.01.2014

Format / Umfang:

6 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

Nagano, M. / Kamata, L. / Tsuchida, H. | British Library Online Contents | 2013

High-Resolution Topography Analysis on Threading Edge Dislocations in 4H-SiC Epilayers

Kamata, I. / Nagano, M. / Tsuchida, H. et al. | British Library Online Contents | 2009

Conversion of Basal Plane Dislocations to Threading Edge Dislocations by Annealing 4H-SiC Epilayers at High Temperatures

Zhang, X. / Nagano, M. / Tsuchida, H. | British Library Online Contents | 2013

Threading dislocations with edge components in GaN epilayers grown on Al~2O~3 substrates

Kang, J. / Ogawa, T. | British Library Online Contents | 2001

Characterization of Basal Plane Dislocations in 4H-SiC Substrates by Topography Analysis of Threading Edge Dislocations in Epilayers

Kamata, I. / Nagano, M. / Tsuchida, H. | British Library Online Contents | 2010

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