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X-ray photoelectron spectroscopy investigations of ultrathin layers grown by ultraviolet-assisted oxidation of SiGe
X-ray photoelectron spectroscopy investigations of ultrathin layers grown by ultraviolet-assisted oxidation of SiGe
X-ray photoelectron spectroscopy investigations of ultrathin layers grown by ultraviolet-assisted oxidation of SiGe
Craciun, V. (Autor:in) / Lambers, E. S. (Autor:in) / Singh, R. K. (Autor:in) / Boyd, I. W. (Autor:in)
APPLIED SURFACE SCIENCE ; 186 ; 237-240
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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