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    X-ray photoelectron spectroscopy investigations of ultrathin layers grown by ultraviolet-assisted oxidation of SiGe

    New search for: Craciun, V.
    New search for: Lambers, E. S.
    New search for: Singh, R. K.
    New search for: Boyd, I. W.

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    X-ray photoelectron spectroscopy investigations of ultrathin layers grown by ultraviolet-assisted oxidation of SiGe

    New search for: Craciun, V.
    New search for: Lambers, E. S.
    New search for: Singh, R. K.
    New search for: Boyd, I. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    X-ray photoelectron spectroscopy investigations of ultrathin layers grown by ultraviolet-assisted oxidation of SiGe

    New search for: Craciun, V.
    New search for: Lambers, E. S.
    New search for: Singh, R. K.
    New search for: Boyd, I. W.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    X-ray photoelectron spectroscopy investigations of ultrathin layers grown by ultraviolet-assisted oxidation of SiGe

    Contributors:

    Craciun, V. (author) / Lambers, E. S. (author) / Singh, R. K. (author) / Boyd, I. W. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 186 ; 237-240

    Publication date:

    2002-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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