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Distribution Profile of Deep Levels in SiC Observed by Isothermal Capacitance Transient Spectroscopy
Distribution Profile of Deep Levels in SiC Observed by Isothermal Capacitance Transient Spectroscopy
Distribution Profile of Deep Levels in SiC Observed by Isothermal Capacitance Transient Spectroscopy
Fujimaki, M. (Autor:in) / Ono, R. (Autor:in) / Kushibe, M. (Autor:in) / Masahara, K. (Autor:in) / Kojima, K. (Autor:in) / Shinohe, T. (Autor:in) / Okushi, H. (Autor:in) / Arai, K. (Autor:in)
MATERIALS SCIENCE FORUM ; 389/393 ; 851-854
01.01.2002
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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Observation of Deep Levels in SiC by Optical-Isothermal Capacitance Transient Spectroscopy
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