Electronic Localization around Stacking Faults in Silicon Carbide

Iwata, H. / Lindefelt, U. / Oberg, S. et al. | British Library Online Contents | 2002

Generation of Oxidation Induced Stacking Faults in Cz Silicon Wafers

Sueoka, K. / Akatsuka, M. / Nishihara, K. et al. | British Library Online Contents | 1995

Study on stacking faults of bainites in a Cu-Zn-Al alloy

Li, C.-M. / Fang, H.-S. / Bo, X.-Z. et al. | British Library Online Contents | 1996

EBIC study on the electrical activity of stacking faults in silicon

Sekiguchi, T. / Shen, B. / Watanabe, T. et al. | British Library Online Contents | 1996

Minority and majority carrier traps associated with oxidation induced stacking faults in silicon

Evans, J. H. / Davidson, J. A. / Saritas, M. et al. | British Library Online Contents | 1995