Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
SEM Visibility of Stacking Faults in 4H-Silicon Carbide Epitaxial and Implanted Layers
SEM Visibility of Stacking Faults in 4H-Silicon Carbide Epitaxial and Implanted Layers
SEM Visibility of Stacking Faults in 4H-Silicon Carbide Epitaxial and Implanted Layers
Zimmermann, U. (Autor:in) / Osterman, J. (Autor:in) / Galeckas, A. (Autor:in) / Hallen, A. (Autor:in) / Bergman, P. / Janzen, E.
01.01.2003
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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