Profiling N-Type Dopants in Silicon

Hovorka, M. / Mika, F. / Mikulik, P. et al. | British Library Online Contents | 2010

Techniques for Depth Profiling of Dopants in 4H-SiC

Osterman, J. / Hallen, A. / Anand, S. et al. | British Library Online Contents | 2001

Depth Profiling of Thin TiSi~x-Films on Silicon Carbide by SNMS

Getto, R. / Freytag, J. / Kopnarski, M. et al. | British Library Online Contents | 1998

Current Voltage Characteristics of High-Voltage 4H Silicon Carbide Diodes

Zimmermann, U. / Hallen, A. / Breitholtz, B. | British Library Online Contents | 2000

Low Voltage Silicon Carbide Zener Diode

Vassilevski, K. V. / Zekentes, K. / Horsfall, A. B. et al. | British Library Online Contents | 2004