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Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling
Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling
Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling
Fielitz, P. (Autor:in) / Borchardt, G. (Autor:in) / Schmucker, M. (Autor:in) / Schneider, H. (Autor:in) / Willich, P. (Autor:in)
APPLIED SURFACE SCIENCE ; 203-204 ; 639-643
01.01.2003
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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