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Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling

Fielitz, P. / Borchardt, G. / Schmucker, M. / Schneider, H. / Willich, P.

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Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling

Fielitz, P. / Borchardt, G. / Schmucker, M. / Schneider, H. / Willich, P.

Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling

Fielitz, P. / Borchardt, G. / Schmucker, M. / Schneider, H. / Willich, P.

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Document information

Title:

Measurement of oxygen grain boundary diffusion in mullite ceramics by SIMS depth profiling

Contributors:

Fielitz, P. (author) / Borchardt, G. (author) / Schmucker, M. (author) / Schneider, H. (author) / Willich, P. (author)

Published in:

APPLIED SURFACE SCIENCE ; 203-204 ; 639-643

Publication date:

2003-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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